With over 6,200 attendees, last week’s 64th ASMS conference in San Antonio, TX was a great success for its organizers.
Syft Technologies exhibited at the ASMS Conference for the first time this year – and we were not disappointed! Visits to our booth and responses to our technical presentations far exceeded expectations.
Our revolutionary message of simple, sensitive, selective, and instantaneous gas analysis using SIFT-MS is being heard and responded to because it fills a critical gap that traditional technologies cannot fill. In particular, application of eight rapidly switchable, ultra-soft chemical ionization agents provides both comprehensive detection (including of traditionally challenging compounds like ammonia, formaldehyde, hydrogen fluoride, and hydrogen sulfide) and high selectivity in real time.