• Automated gas and headspace analysis with extremely high-throughput (>100 samples / hour)
  • Comprehensive analysis, including inorganics and chromatographically challenging compounds
  • Flexible sample delivery options
  • Intuitive software and faster method development
  • Designed and engineered for demanding laboratory applications and the process line


Automation has been widely utilized by traditional chromatographic techniques for many years, enabling instrumentation to be productive 24/7 – a critical consideration because sample throughput is typically only 20 to 60 samples in 24 hours due to the slow analysis. Further, chromatography itself can be a major limitation of traditional techniques because breadth of analysis is constrained: multiple columns or several techniques may be required to comprehensively analyze one sample.

The advent of selected ion flow tube mass spectrometry (SIFT-MS) – a cutting-edge analytical technique that comprehensively analyzes samples to parts-per-trillion (ppt) concentrations within seconds – redefines automation of volatile organic compound (VOC) and inorganic gas analysis. Rapid SIFT-MS analysis provides unique opportunities for high-throughput sample analysis, whether it be for routine VOCs, or chromatographically challenging species (such as ammonia, formaldehyde, hydrogen chloride, and hydrogen sulfide), or any combination of these. SIFT-MS automation presents a major breakthrough in high-throughput headspace and gas analysis, with throughputs in excess of 100 samples/ hour.

Industry Challenges

  • Low sample throughput due to time-limiting chromatography-based analysis
  • Incumbent automated analytical techniques only provide a limited analysis of the samples due to use of chromatographic separation
  • Slow analysis time of current analytical techniques greatly hinders implementation of more extensive quality control testing

How Syft can help

  • Economic analysis due to 4 to >25 times high throughput than conventional methods (ignoring the gains in sampling and sample preparation with SIFT-MS!)
  • Sensitive, quantitative analysis of all VOCs (including formaldehyde) and many inorganic gases with one instrument, delivering greater efficiency
  • Improved quality control through analysis of more samples at much lower cost per sample

Voice200 with Autosampler Gerstel MPS


Selected Ion Flow Tube Mass Spectrometry (SIFT-MS) platform capable of high-throughput gas and headspace analysis for VOCs and inorganic gases.

Gerstel MPS autosampler

Multi-purpose sampler available with wide range of accessories to meet diverse automated analysis needs.

Gerstel Maestro software

Powerful control and scheduling software for the Gerstel MPS.

Autosampler integration kit

All the hardware required for integrating the Voice200ultra and the Gerstel MPS Autosampler .


Software package for viewing and analyzing SIFT-MS data from multiple instruments, customizing analyses, and interacting with the Voice200ultra.

Compound Library

Access detection and quantitation parameters for over 1000 compounds to leverage the diverse capability of the platform.


SIFT-MS provides a very rapid and highly sensitive solution for the detection of VOCs and inorganic gases in headspace samples. Benefits of SIFT-MS include:

  • Direct analysis of very volatile solvents through elimination of chromatographic separation.
  • Very high throughput screening coupled with high sensitivity provides rapid warning of quality issues and greatly reduces the test cost per analysis.
  • Wide linear and dynamic ranges enable one instrument to be applied to multiple analytical tasks.
  • High selectivity and comprehensive analysis provided by eight rapidly switchable reagent ions.

Applications of automated SIFT- MS headspace analysis include:

  • Target compound analysis in foods and beverages
  • Objective sensory screening
  • Residual solvents in pharmaceuticals and packaging.


Headspace Analysis

Simple residual monomer analysis of different powdered polymer pellets, including formaldehyde from POM polymer.

Multiple Headspace Extraction (MHE)

Automated MHE using SIFT-MS: residual styrene monomer determination in polystyrene (PS) pellets.


MHE is a form of static headspace analysis (SHA) that offers significant advantages over equilibrium SHA when working with solid materials and samples where the composition of the matrix varies from sample to sample. Complications due to partitioning are eliminated and the actual amount of VOC in the sample is determined.

SIFT-MS makes the required series of multiple headspace extractions very rapidly. This means that MHE can be used, without suffering the serious time penalty associated with MHE when used in conjunction with GC or GC/MS.

Applications of Multiple Headspace Extraction (MHE) include:

  • Residual solvents in packaging materials
  • Analysis of thermally labile materials
  • Volatile organic compounds in soil samples.


The comprehensive, direct gas analysis capabilities of SIFT-MS make it ideally suited to high-throughput analysis of industry-standard gas sampling devices, such as Tedlar sample bags or SUMMA canisters. No derivatization, drying, or pre-concentration is required for direct analysis to pptv levels. Further, reactive and labile compounds are readily detected and analyzed before they degrade.

Applications of automated gas analysis include:

  • Sample bag analysis for occupational safety and stack gas applications
  • Canister analysis for ambient, indoor air, and process gas analysis
  • Canister cleanliness screening
  • Automated, comprehensive odor analysis (aldehydes, amines, organosulfurs, and volatile fatty acids are all detected effectively in seconds).
Rapid Analysis of Sample Bags and Canisters

Instant quantitation of compounds from Tedlar bags – including aldehydes!

Continuous headspace analysis (CHA)

Continuous analysis of fragrance components as they are slowly released from “Deep Heat”-brand muscle rub.


Chromatographic techniques are highly impractical probes of dynamic processes, because they require that multiple grab samples be taken, followed by prolonged analysis.

As a direct analysis technique, SIFT- MS makes monitoring dynamic processes simple due to the:

  • High time resolution
  • High sensitivity
  • Comprehensive analysis via multiple reagent ions.

When coupled with automation, samples can be run 24 hours/day, speeding up R&D and/or QA testing.

Applications of Continuous Headspace Analysis (CHA) include:

  • Analyzing long-term fragrance or aroma changes
  • Analyzing absorption of VOCs by “scrubbing” materials
  • Monitoring the progress of reactions in chemical processes.

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