Limits of detection (LODs) are of increasing importance to our customers as they strive for higher yields of their product, need to comply with more stringent standards or conduct research at the cutting edge of what is analytically feasible.
One of our R&D Scientists, Hamish Lamotte, presents an online demonstration on determining SIFT-MS LODs.
The demonstration will include:
1. Introduction – what is an LOD?
2. Practical examples of determining the LOD for ethylene oxide:
-a. Using a series of SIFT-MS scans
-b. Using a single SIFT-MS scan
3. Live Q&A
Syft Technologies provides its customers with tools which enable straightforward, pain free LOD determination, as Hamish will demonstrate.