Syft Technologies


Syft Tech Talks 1: A Semi-Technical Introduction to SIFT-MS

Selected ion flow tube mass spectrometry (SIFT-MS) enables selective gas analysis to sub-part-per-trillion levels within seconds. How does it achieve this? Watch this 60-minute webinar to find out. In it, we provide a detailed introduction to the SIFT-MS technique and its analytical performance.

In particular, we cover:

    • The chemical ionization used in SIFT-MS, and how it provides both selectivity and detection of chemically diverse compounds (including ammonia, formaldehyde, and hydrogen sulfide)

    • SIFT-MS quantitation, which is based on ion-molecule reactions, conferring long-term measurement stability and library-based quantitation

Dr. Vaughan Langford

Dr. Vaughan Langford

BSc(Hons), PhD

Principal Scientist


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