Syft Tracer - Next Generation Volatile Impurities Analysis for Enhanced Workflows

14 months ago

This app note introduces the next generation of SIFT-MS, Syft TracerTM, which launched at Pittcon and is debuting worldwide in 2023.  This advancement to SIFT-MS has demonstrated long-term stability, yielding highly reproducible and repeatable quantitative data without the need for daily calibration.  It revolutionizes volatile impurities analysis workflows through unparalleled speed, performance stability, and ease of use.  Learn about how this innovation to real-time trace gas detection eliminates the hassles associated with chromatography and outpaces traditional methods in the analysis of challenging analytes such as formaldehyde in a PEG excipient.

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