“The exhibition floor was particularly busy between the oral sessions, and attendees who dropped by the Syft booth showed interest in the real-time analysis provided by the SIFT-MS technique.”


Diandree Padayachee Syft Technologies Applications Specialist

Dr. Diandree Padayachee

BSc(Hons), MSc, PhD


Application Development Specialist
William Mills Syft Technologies Application Scientist

William Mills

BSc, MBMSc


Marketing Manager

The 2017 ASMS conference was held at the Indiana Convention Center, Indianapolis, from June 4th-8th. Syft Technologies contributed more to the 2017 event than ever before, with an exhibition booth, a corporate poster, two technical posters, a user meeting, and a breakfast seminar. Quantum Analytics, Syft’s US distributor, also attended and supported us at the exhibition booth and all associated events.

We held our first-ever breakfast seminar on June 6th. It was great experience, with attendees asking many questions about the Selected Ion Flow Tube Mass Spectrometry (SIFT-MS) technique and its applications.

The exhibition floor was particularly busy between the oral sessions, and attendees who dropped by the Syft booth showed interest in the real-time analysis provided by the SIFT-MS technique.

Both technical posters drew significant attention:

  • The dual-polarity ion source (DPIS), which has increased the capability and selectivity of SIFT-MS.
  • Direct analysis of formaldehyde – which is currently being adopted by several Big Pharma companies.

Posted by Dr Diandree Padayachee, Applications Specialist at Syft Technologies.

We’d love to keep the conversations going with those we met – or start new ones with those who read this post!

If you would like a copy of either poster, or to learn more about SIFT-MS

Contact Us