“The current semiconductor market is $378 billion with a prediction of $5,600 billion by 2057”


Dr. Yatin J Mange Syft Technologies Application Specialist

Dr. Yatin J. Mange

B.Sc, M.Sc, PhD


Application Specialist / Semiconductor Industry
Yan Li Syft Technologies Application Specialist

Yan Li

B.Sc, ME


Application Specialist

Smart starts here”. That was the 2017 theme at SEMICON West and a perfect match for Syft, because SIFT-MS is the smart choice for process improvement in the semiconductor industry.

The event was held between, July 11 – 13, 2017 at the Moscone Centre, San Francisco. Together with my colleague Yan Li, I was delighted to support our US distributor Quantum Analytics (QA) at their exhibition booth. We used the operational Voice200ultra SIFT-MS instrument to give live demonstrations of continuous and multiple-point analysis of airborne molecular contaminants (AMCs) in real time. 

SEMICON West connects different sectors from the semiconductor industry to come to a common platform to discuss topics that could improve this industry. The conference started with a keynote presentation from Tetsuro Higashi, Corporate Director of TEL, who took us through his 40 years of experience in the semiconductor industry. He mentioned that the current semiconductor market is $378 billion, but is predicted to grow to $5,600 billion by 2057.

The keynote address from Dr Thomas Caulfield, Senior Vice President of Global Foundries, made it clear that as the gate widths in the semiconductor industry get narrower (less than 20 nanometers), AMCs become more and more of an issue at low ppb concentrations.

Currently, there are no real-time techniques to measure a wide range of AMCs reliably and this is where SIFT-MS can have a major impact, because it enables the Fabs to measure diverse AMCs in real-time and immediately report issues. Some of the key benefits of SIFT-MS are:

  • Real-time and continuous monitoring of chemically diverse AMCs which will reduce CapEx
  • Save OpEx through much lower maintenance and consumable requirements
  • Various inlet options with automation options.

SIFT-MS also benefits monitoring of volatile impurities in front-opening unified pods (FOUPs), which are used to transfer the wafers. Any contamination in these FOUPs affects the quality of the wafers they carry.

Still interested? Read more about SIFT-MS in semiconductor industry here.

Posted by Dr. Yatin J. Mange, Applications Specialist at Syft Technologies

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