Learn how SIFT-MS is revolutionising trace analysis across a wide range of applications.


David Hera Syft Technologies Applications Specialist / European Sales Director

David Hera

BSc


Application Specialist

Berlin Seminar, Monday 14th November from 10:00 to 15:00

Syft Technologies, Holtkamp Air Quality Improvement and BAM (German Federal Institute for Materials Research and Testing) invite you to attend a one-day seminar on real-time trace gas analysis of volatile organic compounds and inorganic gases. Learn how Selected Ion Flow Tube Mass Spectrometry (SIFT-MS) is revolutionising trace analysis across a wide range of applications.

Programme:

10:30Introduction to Syft Technologies and Selected Ion Flow Tube Mass Spectrometry
11:00Live demonstration: comprehensive gas analysis in realtime
11:30Presentation from BAM division “Materials and Air Pollutants”
12:00Lunch break (catering provided)
13:00Live demonstration
13:30Applications of SIFT-MS: from environmental and pharmaceutical analysis to food and material testing
14:00Live demonstration: Analysis of customer samples
14:30Closing discussion with Q&A
15:00Finish

 

Event Details


 

Date and Time:
Monday 14th November from 10:00am to 3:00pm
Fully catered

Venue:
Bundesanstalt für Materialforschung und -prüfung (BAM)
Unter den Eichen 44-46
12203 Berlin
Germany

The majority of this event will be held in German, for more information please contact David Hera at Syft Technologies david.hera@syft.com

 

Posted by David Hera, European Sales Director at Syft Technologies