Event Overview

Diandree Padayachee Syft Technologies Applications Specialist

Dr. Diandree Padayachee

BSc(Hons), MSc, PhD

Applications Manager
William Mills Syft Technologies Application Scientist

William Mills


Marketing Manager

The SIFT-MS technique is revolutionizing trace analysis across a range of industries. Together, we will explore real-time and automated trace analysis of volatile organic and inorganic compounds in both gas and headspace.

Please join us for a free breakfast seminar on Selected Ion Flow Tube Mass Spectrometry (SIFT-MS), its automation, and its applications.

Learning Objectives:

  • The fundamentals of the SIFT-MS analytical technique, including its ability to comprehensively analyze samples in real time.
  • How SIFT-MS compares with traditional gas analysis methods, including GC-MS and HPLC.
  • SIFT-MS automation options for high sample throughput.
  • Key applications of SIFT-MS.


Date and Time:
June 6th 7:00am – 8:15am
Room 245
Indiana Convention Center

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