Event Overview

Diandree Padayachee Syft Technologies Applications Specialist

Dr. Diandree Padayachee

BSc(Hons), MSc, PhD

Application Development Specialist
William Mills Syft Technologies Application Scientist

William Mills


North America Sales Manager

The SIFT-MS technique is revolutionizing trace analysis across a range of industries. Together, we will explore real-time and automated trace analysis of volatile organic and inorganic compounds in both gas and headspace.

Please join us for a free breakfast seminar on Selected Ion Flow Tube Mass Spectrometry (SIFT-MS), its automation, and its applications.

Learning Objectives:

  • The fundamentals of the SIFT-MS analytical technique, including its ability to comprehensively analyze samples in real time.
  • How SIFT-MS compares with traditional gas analysis methods, including GC-MS and HPLC.
  • SIFT-MS automation options for high sample throughput.
  • Key applications of SIFT-MS.


Date and Time:
June 6th 7:00am – 8:15am
Room 245
Indiana Convention Center

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