Syft Technologies, Analytical Sciences Group, and GERSTEL invite you to the 2020 North American SIFT-MS User Meeting to be held from July 21 to 23 at the Ohio State University, Columbus, OH. This meeting will showcase the latest applications of SIFT-MS and enhancements to products.
We’re delighted to announce that Professor Sheryl Barringer, The Ohio State University, will be our Plenary Speaker for 2020! Prof. Barringer will present some of her innovative food flavor and food processing research as Chair of Food Science and Technology.
Currently, SIFT-MS is deployed worldwide, providing solutions in a variety of application areas including; health and safety, vehicle testing, semiconductor cleanroom monitoring, consumer product testing, environmental and odor monitoring, and more. SIFT-MS now offers a fully automated direct sampling solution, drastically increasing throughput when running a large number of samples.