“SIFT-MS provides unique opportunities for comprehensive characterisation of volatile emissions from diverse materials”


Vaughan Langford Syft Technologies Director - Applications & Marketing

Dr. Vaughan Langford

BSc(Hons), PhD


Principal Scientist / Consultant

High-throughput analysis using selected ion flow tube mass spectrometry (SIFT-MS) provides unique opportunities for comprehensive characterisation of volatile emissions from diverse materials.  The innovative sample ionisation used in SIFT-MS enables headspace and gas samples containing chromatographically challenging compounds (such as ammonia, formaldehyde, and hydrogen sulphide) to be analysed with a throughput in excess of 100 samples per hour using automated SIFT-MS.

In this webinar, we will introduce SIFT-MS and describe applications including:

  • Residual monomer analysis in polymers
  • Residual solvent analysis in packaging
  • Emissions from natural materials
  • High-efficiency multiple headspace extraction (MHE) for determination of absolute concentrations in products.
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