Vaughan Langford Syft Technologies Director - Applications & Marketing

Dr. Vaughan Langford

BSc(Hons), PhD

Principal Scientist / Consultant

SIFT-MS can continuously analyze of volatiles that indicate non-conformance of raw materials, such as bulk gases utilized in semiconductor manufacture. By coupling SIFT-MS with multivariate statistical analysis, continuous quality assurance measurements can be realized.

In this webinar, Syft Technologies’ Principal Scientist Dr Vaughan Langford will describe how SIFT-MS can employed in both targeted and untargeted operational modes to enhance quality assurance and increase yields via continuous monitoring.