Selected ion flow tube mass spectrometry (SIFT-MS) enables selective gas analysis to sub-part-per-trillion levels within seconds. How does it achieve this?
In this 60-minute webinar, we provide a detailed introduction to the SIFT-MS technique and its analytical performance. In particular, we cover:
- The chemical ionization used in SIFT-MS, and how it provides both selectivity and detection of chemically diverse compounds (including ammonia, formaldehyde, and hydrogen sulfide).
- Outline SIFT-MS quantitation, which is based on ion-molecule reactions, conferring long-term measurement stability and library-based quantitation.
- The origins and significance of the SIFT-MS analytical technique
- The basics of the SIFT-MS Technique
- Interlude: Where SIFT-MS fits among analytical techniques
- Quantitation in SIFT-MS
- Broad-spectrum and selective analysis: the chemistry of SIFT-MS
- Practical benefits of SIFT-MS
- Frequently asked questions (FAQs)