“In this 60-minute SIFT-MS webinar, we will provide a detailed introduction to the our technique and its analytical performance”

Vaughan Langford Syft Technologies Director - Applications & Marketing

Dr. Vaughan Langford

BSc(Hons), PhD

Principal Scientist / Consultant

Selected ion flow tube mass spectrometry (SIFT-MS) enables selective gas analysis to sub-part-per-trillion levels within seconds. How does it achieve this?
In this 60-minute webinar, we provide a detailed introduction to the SIFT-MS technique and its analytical performance. In particular, we cover:

  • The chemical ionization used in SIFT-MS, and how it provides both selectivity and detection of chemically diverse compounds (including ammonia, formaldehyde, and hydrogen sulfide).
  • Outline SIFT-MS quantitation, which is based on ion-molecule reactions, conferring long-term measurement stability and library-based quantitation.

Webinar outline:

  • The origins and significance of the SIFT-MS analytical technique
  • The basics of the SIFT-MS Technique
  • Interlude: Where SIFT-MS fits among analytical techniques
  • Quantitation in SIFT-MS
  • Broad-spectrum and selective analysis: the chemistry of SIFT-MS
  • Practical benefits of SIFT-MS
  • Frequently asked questions (FAQs)