Vaughan Langford Syft Technologies Director - Applications & Marketing

Dr. Vaughan Langford

BSc(Hons), PhD


Principal Scientist / Consultant

SIFT-MS provides rapid analysis of volatiles that indicate non-conformance of foods and ingredients. By coupling SIFT-MS with GERSTEL automation and multivariate statistical analysis, high-throughput quality assurance measurements for aroma defects can be realized.

In this webinar, Syft Technologies’ Principal Scientist Dr Vaughan Langford will describe how SIFT-MS can be employed in both targeted and untargeted operational modes to achieve high-throughput detection of product defects. Case studies from edible oils, cheese, and flavor mixes will be described.