Syft Tech Talks
#3. Introduction to the Ion Chemistry of SIFT-MS
Vaughan Langford, PhD, Principal Scientist, Syft Technologies, New Zealand
Highly controlled gas-phase reactions of ultra-low energy ions with volatile compounds enable Syft Technologies’ SIFT-MS instruments to analyze volatile compounds in air and headspace in real time while remaining “blind” to permanent gases such as nitrogen, oxygen, and argon.
In this Syft Tech Talk, Dr Vaughan Langford – Principal Scientist at Syft Technologies – introduces the ion-molecule chemistry utilized in SIFT-MS instrumentation. This highly controlled, ultra-soft chemical ionization approach enables SIFT-MS instruments to comprehensively analyze samples with high specificity in real-time.
If you are a user of a Syft Tech SIFT-MS instrument – or simply curious! – then you will find this educational Talk, very helpful!