Syft Tech Talks
#5. SIFT-MS: Precision Ionization Control via Ultra-Soft Chemical Ionization (USCI)
Vaughan Langford, PhD, Principal Scientist, Syft Technologies, New Zealand
At the most fundamental level, what really differentiates SIFT-MS from other direct mass spectrometry techniques? It’s the unique combination of ions generated conveniently from moist or dry air coupled with the ultra-soft chemical ionization (USCI) approach applied in the SIFT-MS instrument’s flow tube. And these ions are switchable in real time for maximum selectivity!
This Syft Tech Talk emphasizes some of the most unique – and powerful – attributes of the SIFT-MS technique for sensitive and selective analysis of the widest range of volatiles.
Dr Vaughan Langford is a Principal Scientist at Syft Technologies in New Zealand. Vaughan joined Syft in 2002 after completing his PhD in Physical Chemistry at the University of Canterbury, and post-doctoral fellowships at the Universities of Geneva, Western Australia, and Canterbury. With an extensive background in diverse applications of SIFT-MS, he provides advanced applications training and support to SIFT-MS users globally.