Syft Technologies will present their innovative SIFT-MS technique and its numerous applications to detect volatile organic compounds in Chicago, Detroit, and Cincinnati.


William Kerr Application Scientist

Dr. Will Kerr

BSc(Hons), PhD


Application Scientist

Syft Technologies is hosting a free workshop to demonstrate the power of Selected Ion Flow Tube Mass Spectrometry (SIFT-MS) for trace gas analysis. This is a fantastic opportunity to see first-hand how SIFT-MS works and to explore how this innovative technique can add efficiency and simplicity to routine gas analysis; from R&D to final product testing.

Currently, SIFT-MS is deployed worldwide, providing solutions in a variety of application areas including; health and safety, vehicle testing, semiconductor cleanroom monitoring, consumer product testing, environmental and odor monitoring, and more.

Attendees will learn:

  • How SIFT-MS compares with traditional techniques (such as GC-MS and HPLC-MS)
  • How the real-time analytical technique is utilized in their industry
  • How the technology can add value to their area of work/research

This event includes a hands-on demonstration of sample analysis using a Voice200ultra SIFT-MS instrument along with a run-through of method development and sample delivery.

Calendar

CityDate / TimeVenue
Chicago / Geneva, Il24th of July

13:00-16:00

FONA International Inc. Geneva

Register

Detroit / Troy, MI26th of July

10:00-15:00

Detroit Marriott Troy

Register

Cincinnati, OH31st of July

10:00-15:00

Courtyard by Marriott Cincinnati Blue Ash

Register

 

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