Syft Technologies will present their innovative SIFT-MS technique and its numerous applications to detect volatile organic compounds in Chicago, Detroit, and Cincinnati.


William Kerr Application Scientist

Dr. Will Kerr

BSc(Hons), PhD


Environmental Technical Specialist

Syft Technologies is hosting a free workshop to demonstrate the power of Selected Ion Flow Tube Mass Spectrometry (SIFT-MS) for trace gas analysis. This is a fantastic opportunity to see first-hand how SIFT-MS works and to explore how this innovative technique can add efficiency and simplicity to routine gas analysis; from R&D to final product testing.

Currently, SIFT-MS is deployed worldwide, providing solutions in a variety of application areas including; health and safety, vehicle testing, semiconductor cleanroom monitoring, consumer product testing, environmental and odor monitoring, and more.

Attendees will learn:

  • How SIFT-MS compares with traditional techniques (such as GC-MS and HPLC-MS)
  • How the real-time analytical technique is utilized in their industry
  • How the technology can add value to their area of work/research

This event includes a hands-on demonstration of sample analysis using a Voice200ultra SIFT-MS instrument along with a run-through of method development and sample delivery.

Calendar

CityDate / TimeVenue
Chicago / Geneva, Il24th of July

13:00-16:00

FONA International Inc. Geneva

Register

Detroit / Troy, MI26th of July

10:00-15:00

Detroit Marriott Troy

Register

Cincinnati, OH31st of July

10:00-15:00

Courtyard by Marriott Cincinnati Blue Ash

Register